
Carbon-Dot Interface Enables Ultrathin High-κ Dielectrics on 2D Semiconductors (UIUC, NETL, Argonne, Monash)
<a href="https://news.google.com/rss/articles/CBMi0wFBVV95cUxPYkRDWHZPb1RFbU5CRFkyajdiUXJJTHUwR3Bzc3N1N2VoTjhfUnpmcXE1bVJ1WEdNdXQyRVZOVVFMMTJOMmRfWUZTc18wVXk1RXd5dXVSdWVPLXYxTzJUMUFlRGZBMnN3UWRrT25PaFNIUkc1TmVPZjhUM29nQXJPWmlsUjl2RDE2cnhNMUNoWFNJbkJiWlpjcnJYdU0zdzZIR2FaRGZBaW5nc2V1a3JBT2d5YklVekpmSzQxLWJpVFI3c2FkV1BfblNXWkFtZWJEeC1V?oc=5" target="_blank">Carbon-Dot Interface Enables Ultrathin High-κ Dielectrics on 2D Semiconductors (UIUC, NETL, Argonne, Monash)</a>&nbsp;&nbsp;<font color="#6f6f6f">Semiconductor Engineering</font>
