
Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method
<a href="https://news.google.com/rss/articles/CBMidkFVX3lxTE8tUVRadk5EY1hvcXpscmswcWNmODE2bEJMai1SakZhRFVWWHRQbkpkN0N6bXJVNXhRUzhnY1VuSDZrbXNjOWtMbVZRWnNlZjFra2N4ZW52el9LU3pWaHJZR1dKMVdJU1pFM2tTbXFzN093ZGxsRXc?oc=5" target="_blank">Traction Force Microscopy for Viscoelastic Substrates: A Semi‐Analytical Method</a>&nbsp;&nbsp;<font color="#6f6f6f">Wiley & Sons</font>

